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Electron Microscopy Solutions

Preparing the highest quality S/TEM samples with DualBeam technology

Microscopy & Analysis Webcast

View our exclusive webcast - hosted by Microscopy & Analysis magazine - and discover how Thermo Scientific™ DualBeam™  and FIB solutions can help you quickly prepare the highest quality, site-specific samples required for techniques like S/TEM imaging and analysis or atom probe microscopy.

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