|   Electron Microscopy Solutions

    
Electron Microscopy Solutions
Scanning Electron Microscope

Teneo VS SEM for Life Sciences

Highest quality isotropic 3D data from large sample volumes

The FEI Teneo VS™ scanning electron microscope (SEM) is a novel serial block-face imaging solution that enables excellent z-resolution from Multi-Energy Deconvolution SEM combined with the efficiency of in situ sectioning. The Teneo VS SEM unravels the complex 3D architecture of cells and tissues in their natural context, which is crucial for gaining understanding of the structure function correlation in biological systems. The Teneo VS SEM's automation and ease-of-use increase the productivity of operators of varying levels of expertise, allowing for acquisition of large sample volumes at isotropic resolution.




Need more information?

Contact a Sales or Service Representative

Key Benefits

Truly isotropic 3D data from large volumes:
Excellent z-resolution from Multi-Energy Deconvolution SEM combined with the efficiency of in situ sectioning.

Highest contrast and resolution on all samples:
Highest contrast and optimal SNR with in-lens and in-column detectors for HiVac, as well as dedicated detectors for optimal resolution in LoVac.

Simple switch between normal SEM use and serial block face imaging:
Compact, stage-mounted microtome allowing easy exchange.

Instant productivity for all operators:
High degree of automation and design for ease-of-use adding to operator efficiency and inspiring greater experimentation.

Increased efficiency and accuracy thanks to workflow solutions:
Fast identification of regions of interest by CLEM approaches and large volume coverage with automated multi-tile set runs.

Featured Document

The Teneo VS SEM Datasheet

Teneo VS is a novel Serial Block Face Imaging solution that combines mechanical and optical sectioning using FEI's proprietary Multi-Energy Deconvolution technology to facilitate automated acquisition of large sample volumes at isotropic resolution.

Download document

Application Examples

Imaging of challenging samples is possible with a dedicated low-vacuum imaging detector. No charging artifacts present, as shown in this mouse kidney tissue.
Challenge of Serial Block Face Imaging (SBFI); High vacuum imaging of resin embedded tissue. Arrow heads showing charging artifacts.
Nominal isotropic resolution of 10x10x10nm (x,y,z), 222 slices (physical + optical) @ 30nm (nominal thickness of a physical cut), volume of 20um x 17um x 2.2μm. Sample: Jean-Marc Verbavatz, MPI of Molecular Cell Biology and Genetics, Germany.
 
View more application examples for Teneo VS
 

Electron Microscopy Solutions

We have updated the appearance of FEI.com with the Thermo Fisher Scientific brand. This transition is an exciting moment as we continue to advance our world-leading electron microscopy solutions.