Cell Navigator software automatically locates the proverbial needle in a haystack. This software has the ability to navigate to a single SRAM bit in a 50nm lateral field. Traditionally, electrical bit failures could only be located for failure analysis by having operators manually count redundant memory cells to arrive at the location of interest. Painstaking and error prone manual counting can now be eliminate through the use of FEI’s Cell Navigator solution. This technology ensures consistent and repeatable navigation to features where cutting edge design rules have been deployed. In Conjunction with iFast Developers Kit Pro automated recipes can be generated to locate and process demanding features in a routine manner.