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Electron Microscopy Solutions

Introducing our Newest Innovative Products for Electronics Industry

Thermo Fisher Scientific is the world leader in physical and electrical analysis solutions for the electronics industry. Our latest next-generation products focus on advanced analytical capabilities for failure analysis and process control. These solutions are designed to help increase productivity in semiconductor fabs and labs by improving quality control and yield in the manufacture of 3D NAND, logic, DRAM, analog and display devices. 

Customers can lose over a million dollars with each day’s delay in time to market for new products. From the moment you purchase a Thermo Fisher Scientific system, your success becomes our utmost priority. From installation services to maintenance and applications agreements, our team of experts is here to support you at every step. 

By improving time to TEM data, Thermo Fisher Scientific enables our customers to make yield improvement decisions more quickly. We are able to accelerate time to data by being the only company that provides a fully automated wafer-to-TEM data workflow. 

We proudly introduce our newest innovative products for the electronics industry: 

Verios G4 Extreme High-Resolution SEM

The Thermo Scientific™ Verios G4 XHR SEM is an extreme high-resolution (XHR) scanning electron microscope that provides manufacturers the capability and flexibility they need to determine the root causes of defects, yield losses, and process and product failures. It is an SEM-only solution derived from our widely successful Helios family of DualBeam (focused ion beam/SEM) instruments. The Verios G4 XHR SEM offers the best performance across the widest range of conditions, especially at the low voltages required for beam-sensitive materials used in advanced processes.

Learn more about the Verios G4 SEM

Hyperion II Fast and Efficient Nanoprober

Nanoprobers make direct electrical measurements of individual transistors. The next-generation Thermo Scientific Hyperion II Nanoprober, the only nanoprober based on an atomic force microscope (AFM), eliminates the vacuum requirements and e-beam/sample interactions of SEM-based nanoprobers. The Hyperion II Nanoprober’s automated operation and imaging modes make it fast and easy to use, while its ability to precisely localize electrical faults greatly improves the speed and efficiency of subsequent DualBeam or TEM analysis.

Learn more about the Hyperion II Nanoprober

iCAP TQs ICP-MS for Fast and Reliable Chemical Monitoring

The Thermo Scientific iCAP TQs Inductively Coupled Plasma-Mass Spectrometer (ICP-MS) is a dedicated semiconductor version of the well-established iCAP TQ ICP-MS. It provides the fast, efficient, reliable, reproducible monitoring of low-level impurities in ultra-high-purity (UHP) chemicals required to support automated at-line monitoring and statistical process control for advanced semiconductor manufacturing processes. The iCAP TQs ICP-MS provides low detection limits for all relevant chemicals and yields faster measurements with less operator attention. Moving chemical analysis from the lab to the fab is now possible with this new system and allows at-line control of chemical baths, which improves response times and minimizes contamination-related losses.

Learn more about the iCAP TQs ICP-MS