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Electron Microscopy Solutions
Transmission Electron Microscope

Metrios TEM

The first TEM dedicated to the semiconductor industry

The FEI Metrios system is the first transmission electron microscope (TEM) dedicated to providing the fast, precise measurements that semiconductor manufacturers need to develop and control their wafer fabrication processes. Extensive automation of the basic TEM operation and measurement procedures minimizes requirements for specialized operator training. Its advanced automated metrology routines deliver greater precision than manual methods. The Metrios TEM is designed to provide customers with improved throughput and lower cost-per-sample than other TEMs.

Metrios SEM for Semiconductors

High volume TEM data, accurate and repeatable
- at the lowest cost-per-sample

Advanced logic and memory manufacturing processes are becoming more reliant on fast turnaround of precise structural and analytical data to be able to quickly calibrate tool sets, diagnose yield excursions and optimize process yields.  At technology nodes below 28nm, especially in cases where non planar device designs are being implemented, conventional SEM or optical based analysis and inspection tools cannot provide useful data. FEI's Metrios TEM automates the basic TEM operation and measurement procedures and minimizes the requirements for specialized operator training. Its advanced automated metrology routines deliver significantly greater precision than manual methods. The Metrios TEM is designed to deliver high volume TEM data, accurate and repeatable operation - at the lowest cost-per-sample.

Product Models

2017 Nobel Prize in Chemistry

Congratulations to the winners of the 2017 Nobel Prize in Chemistry. Three scientists; Dr. Jacques Dubochet, Dr. Joachim Frank, and Dr. Richard Henderson, were awarded the prize for their developments within Cryo-Electron Microscopy.

We are extremely proud of what these researchers and the structural biology community have achieved.