Discover the world of eXtreme High-Resolution SEM
Verios is the second generation of FEI's leading XHR SEM family, offering accurate imaging with sub-nanometer resolution from 1 to 30 kV energy range. It provides the excellent contrast needed for precise measurements on materials in a variety of applications without compromising the high throughput, analytical capabilities, sample flexibility, and ease of traditional SEMs. Verios features unique technologies such as constant power lenses for higher thermal stability and electrostatic scanning for higher deflection linearity. It is extremely flexible when it comes to choosing parameters, working on large samples, or supporting additional applications like analysis or lithography. Verios XHR SEM allows both occasional users and specialists to access accurate and complete nanoscale data in the shortest time, discovering information that previously has been unavailable from other techniques.
Verios XHR SEM Datasheet
The Verios is the second generation of FEI's leading XHR SEM family, offering sub-nanometer resolution over the full 1 keV to 30 keV energy range with excellent materials contrast.