Scanning Electron Microscope
Ultra High Resolution imaging and high throughput analytical performance.
For metals researchers, academic and industrial research institutions, the FEI Teneo scanning electron microscope (SEM) provides Ultra High Resolution imaging together with the highest throughput analytical performance. A revolution in detection - the unique Trinity™ detection scheme delivers highest contrast on the widest range of samples for fastest imaging and easy interpretation of images. With three separate in-lens detectors operating simultaneously with the standard chamber detector, simultaneous detection from all angles can be performed, saving time, maximizing information and preventing sample contamination and damage.