Nova NanoSEM

The Nova NanoSEM™ scanning electron microscope delivers best in class imaging and analytical performance in a single, easy-to-use instrument. Specifically designed to streamline operations in your laboratory, the Nova NanoSEM enables owners the ability to gain the most comprehensive answers in the least amount of time. This propels productivity, without sacrificing on the quality imaging you demand from your daily work. 

With the Nova NanoSEM 50 series, even more becomes possible. In addition to the powerful combination of advanced optics (including a two-mode final lens), SE/BSE (Secondary Electrons/Backscattered Electrons) in-lens detection and beam deceleration, the Nova NanoSEM 50 series introduces a new suite of latest generation, high sensitivity retractable SE/BSE and STEM detectors, as well as versatile SE/BSE filtering capabilities, to best optimize the information of interest. Intelligent scanning modes are available to minimize imaging artifacts.

Nova NanoSEM for Materials Science

In a materials lab environment that demands an instrument be flexible enough to deliver the precise information necessary across a wide variety of sample types, having both imaging and analytical performance is something owners appreciate. With Nova NanoSEM You can easily switch instrument conditions based on types of samples you are investigating or types of analytical work you need to perform.

With Nova NanoSEM you can:

  • Expand your research capabilities by handling a wider range of sample types 
  • High resolution imaging - low voltage [1kV] resolution is 1.4 nm in high vacuum mode, while for non-conductive materials, the Nova NanoSEM is unique in offering the highest resolution (1.8nm) at low voltages (3kV)
  • Both a high current beam (essential for rapid EDS/EBSD/CL/analytical research) and high resolution at high and low voltage which is essential for image quality across a wide range of sample type 
  • Strong performance in low vacuum mode gives you more analytical power - when you need top quality analytical data on samples like glass, ceramics or other non-conductive materials  


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