The Apreo scanning electron microscope's (SEM) revolutionary compound lens design combines electrostatic and magnetic immersion technology to yield unprecedented resolution and signal selection. This makes the Apreo SEM the platform of choice for research on nanoparticles, catalysts, powders and nanodevices, without compromising on magnetic sample performance.
The Apreo SEM benefits from the unique in-lens backscatter detection, which provides excellent materials contrast, even at tilt, short working distance, or on sensitive samples. The novel compound lens further improves contrast with energy filtering and adds charge filtering for imaging of insulating samples. The optional low vacuum mode now has a 500 Pa maximum chamber pressure for imaging even the most demanding insulators.
With all these options, including the compound final lens, advanced detection and flexible sample handling, the Apreo SEM's performance and versatility will meet your research challenges for many years to come.