Focused Ion Beam Microscope
Vion Plasma Focused Ion Beam
The FEI Vion™ Plasma Focused Ion Beam System (Plasma FIB) adds significantly more capacity to your lab, with best-in-class milling and imaging performance in a single, easy-to-use instrument. By incorporating plasma ion source technology, the Vion Plasma FIB delivers increased throughput over conventional gallium FIB instruments-with speeds more than 20x faster for site-specific cross-sectioning and large area milling, as well as sample preparation. With both excellent milling precision and high-resolution imaging at low beam currents, the Vion Plasma FIB delivers the speed, accuracy and high contrast images essential for a wide range of process control, failure analysis or materials research applications.