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Electron Microscopy Solutions
Focused Ion Beam Microscope

Vion Plasma Focused Ion Beam

The Thermo Scientific™ Vion™ Plasma Focused Ion Beam System (Plasma FIB) adds significantly more capacity to your lab, with best-in-class milling and imaging performance in a single, easy-to-use instrument. By incorporating plasma ion source technology, the Vion Plasma FIB delivers increased throughput over conventional gallium FIB instruments-with speeds more than 20x faster for site-specific cross-sectioning and large area milling, as well as sample preparation. With both excellent milling precision and high-resolution imaging at low beam currents, the Vion Plasma FIB delivers the speed, accuracy and high contrast images essential for a wide range of process control, failure analysis or materials research applications.

 

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Vion Plasma FIB for Materials Science

Especially well-suited for metals, composites and coatings, the Vion Plasma FIB supports a range of materials characterization, failure analysis and sample preparation applications.


  • Create site-specific cross sections quickly while directly imaging samples for real-time monitoring
  • Achieve greater milling speed without sacrificing quality for large area and repetitive milling projects, as well as for low sputter rate materials like steel
  • Perform fast, site-specific micromachining of structures and surfaces for dynamic compression or tensile testing.
  • Prepare high quality, site-specific surfaces for Electron Back Scattered Diffraction analysis Prepare specimens for other imaging and characterization techniques like SEM and TEM
  • Gain sub-30 nm image resolution for quick identification and metrology of thin layers and structures.

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