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Electron Microscopy Solutions
Focused Ion Beam Microscope

OptiFIB Focused Ion Beam

Circuit edit systems leading the industry in precision and throughput

The FEI OptiFIB Focused Ion-Beam (FIB) circuit edit systems uses FIB technology and advanced chemistry to modify individual circuit elements. These edits are designed to validate design changes before expensive and time-consuming modifications are implemented on photomask sets. Featuring patented coaxial columns, our circuit edit systems lead the industry in precision and throughput, as well as offering the broadest range of FIB chemistries available.

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The OptiFIB for Semiconductors

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2017 Nobel Prize in Chemistry

Congratulations to the winners of the 2017 Nobel Prize in Chemistry. Three scientists; Dr. Jacques Dubochet, Dr. Joachim Frank, and Dr. Richard Henderson, were awarded the prize for their developments within Cryo-Electron Microscopy.

We are extremely proud of what these researchers and the structural biology community have achieved.