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Electron Microscopy Solutions
Focused Ion Beam Microscope

OptiFIB Focused Ion Beam

Circuit edit systems leading the industry in precision and throughput

The FEI OptiFIB Focused Ion-Beam (FIB) circuit edit systems uses FIB technology and advanced chemistry to modify individual circuit elements. These edits are designed to validate design changes before expensive and time-consuming modifications are implemented on photomask sets. Featuring patented coaxial columns, our circuit edit systems lead the industry in precision and throughput, as well as offering the broadest range of FIB chemistries available.

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The OptiFIB for Semiconductors

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Electron Microscopy Solutions

We have updated the appearance of FEI.com with the Thermo Fisher Scientific brand. This transition is an exciting moment as we continue to advance our world-leading electron microscopy solutions.