Learn More
Events calendar
ASNT Annual Conference 2017
APCNDT 2017
News
Quattro ESEM
Talos F200i TEM
Explore MyScope Outreach
The 2016 Image Contest Grand Prize Winner
Spider Skin
ASCB 2017
Aquilos Cryo-FIB
Krios G3i Cryo-TEM
Glacios Cryo-TEM
What's new in PerGeos 1.1
Webcast: How Image Accuracy Impacts Your Research
Subscribe for FEI Communications
You have successfully signed up for FEI newsletters.
FEI Focused Ion Beam systems (FIBs) are well suited to a wide range of process control, failure analysis, and materials research applications.
Contact a Sales or Service Representative
Electron Microscopy Solutions
We have updated the appearance of FEI.com with the Thermo Fisher Scientific brand. This transition is an exciting moment as we continue to advance our world-leading electron microscopy solutions.