ICTMS 2017 : Avizo workshop
Microscopy & Microanalysis 2017
Explore MyScope Outreach
24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2017)
The 2016 Image Contest Grand Prize Winner
Amira for Cell Biology available in March
What's new in PerGeos 1.1
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FEI Focused Ion Beam systems (FIBs) are well suited to a wide range of process control, failure analysis, and materials research applications.
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