The Thermo Scientific™ Meridian-IV system is the preferred choice for developers of advanced, low-voltage, high-density semiconductor devices requiring best-in-class performance and the ability to diagnose wide ranging failure modes, including parametric failures and those resulting from design-process marginalities.
Capabilities
- Standard best-in-class InGaAs-based emission detection or
- High sensitivity extended-wavelength DBX-based emission detection
- Patented, industry-proven "Point & Click" Solid Immersion Lens (SIL)
- Inverted platform for easy ATE direct docking
- Compatibility with most popular third-party EDA applications
- >Optional laser scanning microscope (LSM) for static and dynamic analysis
- Works easily with packaged parts and wafer/die backside samples
- Optional 350x long working distance SIL