Versa 3D for Materials Science
Developing next generation products requires new materials science tools and capabilities to give researchers the required characterization data to really understand how materials are interconnected and what properties are important for function. This means applying techniques like 3D data acquisition to fully understand material properties. Traditionally, a Scanning Electron Microscope (SEM) provided enough capabilities for most investigations, but for exploring and developing next generation materials, both SEM and Focused Ion Beam (FIB) technology is required. And of the different kinds of SEM/FIB instruments available, the Versa 3D is the one that offers more capabilities to meet the demands for advanced material analysis, especially for non-conductive materials and samples that require characterization in their natural states.
If you are already familiar with a SEM, consider the many other applications that you can achieve using DualBeam technology and the Versa 3D. You get more capabilities in one platform with fewer limitations to your research options.