With its unique, flexible detection scheme, the FEI Scios™ DualBeam™ offers simultaneous detection of all information with excellent contrast at high acquisition speeds and high resolution at low kV. This makes it ideal for imaging a wide range of samples, including very sensitive materials. Fully automated column alignments limit the need for highly trained operators, while predefined use cases for common conditions give instant productivity to everyone, which is especially relevant to multi-user facilities.
Efficient workflows enable the Scios DualBeam to produce accurate results in the shortest possible time. The Amira SDB wizard streamlines the steps necessary for accurate analysis and visualization of 3D data sets acquired on the Scios DualBeam. Correlative Light and Electron Microscopy (CLEM) targeted AutoSlice & View provides a true workflow solution for finding the precise location of the region of interest in a large volume, enabling high-resolution imaging and simplified, high-precision, cryo-TEM sample prep. Such precision offers the highest yield without contamination, even when working with challenging samples.