Highest quality, ultra-thin TEM lamella
(catalytic activated filter sample) produced with the Helios G4 DualBeam using iFast-based guided TEM sample preparation workflow.
Helios G4 FX DualBeam™ Datasheet
The Helios G4 FX DualBeam™ is part of the fourth generation of the industry-leading Helios DualBeam™ family. It is carefully designed to meet the needs of scientists and engineers by offering the best all-in-one STEM sample preparation and imaging solution. The Helios G4 FX DualBeam™ combines the innovative Elstar electron column with high-current UC+ technology for extreme high-resolution imaging and highest materials contrast, in-lens STEM 4 for sub-3Å, in situ, low-kV STEM imaging, and the superior Phoenix ion column for the fastest, easiest, and most precise, high-quality sample preparation and 3D characterization, even on the most challenging samples.