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Electron Microscopy Solutions

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DualBeam

FEI DualBeam Focused Ion Beam-Scanning Electron Microscope systems (FIB-SEMs) deliver highest performance for sample preparation, 3D characterization, nanoprototyping, and industrial failure analysis.

Electron Microscopy Solutions

We have updated the appearance of FEI.com with the Thermo Fisher Scientific brand. This transition is an exciting moment as we continue to advance our world-leading electron microscopy solutions.