Metals

Globally, large investments are being made in development of metals products for transportation infrastructure and vehicles, energy production and machinery, building materials and even consumer products. These investments are fueled by the need to develop metals that are lighter, stronger and more durable throughout their use.

To fully understand all of the properties of steel or alloys requires technology with workflows that provide visibility at multiple scales, to reveal structure and composition, as well as any possible defects, in the full context of the area in which they occur.

Materials Scientists working in metals research are using FEI solutions to gain a deeper understanding of not only the physical properties of steel and alloys, but also to be able to predict their performance in real world conditions. Using workflows to gain understanding of structure-property relationships, from macro to atomic scale, these scientists are making the discoveries that are leading to cleaner production, safer, more durable products and new applications for metals. 

New Apreo SEM

Apreo's revolutionary compound lens design combines electrostatic and magnetic immersion technology to yield unprecedented resolution and materials contrast. This makes Apreo the platform of choice for research on nanoparticles, catalysts, powders and nanodevices, without compromising on magnetic sample performance.

Learn more about Apreo SEM .

New Helios G4 PFIB DualBeam™

New Helios PFIB DualBeam, FEI's first plasma based FIB/SEM, is designed for high throughput, large volume processing, combined with extreme high resolution imaging in both 2D and 3D. Providing the highest quality of data in the shortest time, Helios PFIB DualBeam is the ideal research partner for a variety of materials science applications such as large scale cross-sectioning, large volume 3D data collection or large scale patterning.

 Learn more about Helios G4 PFIB.

Featured Product

New Talos™ TEM

Talos TEM delivers fast, high throughput STEM images that reveal atomic structure, defects, grain and interface structure of various materials, including metals and alloys, and enables you to perform rapid, precise, quantitative EDS analysis to uncover the chemical composition of these materials. Learn more about Talos TEM and how this new research partner can help you to deliver breakthroughs in Metals research.

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Featured Webcast

10 6 and beyond-New research applications for Materials Science

Due to their greater throughput capabilities, Xe Plasma FIB/SEMs have enabled researchers to access larger volumes of materials and metals with large grain structure to improve statistical accuracy for 2D and 3D analysis. Register for our Materials Today webinar to learn about the ultra-high-resolution capabilities of Xe Plasma FIB technology in addition to its wider potential for a variety of characterization techniques, such as preparing samples for mechanical tests, TEM analysis, and site-specific EBSD and EDS.

Discover Automated Inclusion Analysis for Steel Production 

With the Metals Quality Analyzer, you have the power to make quality control decisions faster and more economically than ever before. Now, you can automatically detect, analyze, classify and document thousands of non-metallic inclusions per hour.  

Learn more

Documents

3-D Materials Characterization over a Range of Time and Length Scales

Learn how the University of Manchester is using their suite of FEI instruments to solve materials research challenges in multiple scales and dimensions.

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Products for Metals

Apreo SEM for Materials Science
The Apreo SEM's revolutionary compound lens design combines electrostatic and magnetic immersion technology to yield unprecedented resolution and signal selection. This makes the Apreo SEM the platform of choice for research on nanoparticles, catalysts, powders and nanodevices, without compromising on magnetic sample performance.
Talos F200X TEM for Materials Science
The FEI Talos F200X scanning/transmission electron microscope combines outstanding high-resolution S/TEM and TEM imaging with industry-leading energy dispersive x-ray spectroscopy (EDS) signal detection and 3D chemical characterization with compositional mapping. The Talos F200X S/TEM allows for the fastest and most precise EDS analysis in all dimensions (1D-4D), along with the best HRTEM imaging with fast navigation for dynamic microscopy. The FEI Talos F200X S/TEM does all this while also providing the highest stability and longest uptime.
Talos F200S TEM for Materials Science
The FEI Talos™ F200S scanning/transmission electron microscope (S/TEM) combines outstanding high-resolution S/TEM and TEM imaging with industry-leading energy dispersive x-ray spectroscopy (EDS). The Talos F200S S/TEM features the greatest versatility and the highest throughput in STEM imaging. It allows for the most precise EDS analysis and the best HRTEM for dynamic microscopy. The FEI Talos F200S S/TEM does all this while also providing the highest stability and longest uptime.
Scios 2 DualBeam for Materials Science

The FEI™ Scios™ 2 DualBeam™ is an ultra-high-resolution analytical FIB-SEM system that provides outstanding sample preparation and 3D characterization performance for the widest range of samples, including magnetic and non-conductive materials. 

Helios G4 CX DualBeam for Materials Science
The latest technological innovations of the FEI Helios G4 CX DualBeam™ microscope, in combination with the easiest to use, most comprehensive software and FEI's application expertise, allow Helios G4 CX with optional AS&V4 software for the highest-quality, fully automated acquisition of multi-modal 3D datasets.
Helios G4 UX DualBeam for Materials Science
The latest technological innovations of the FEI Helios G4 DualBeam™ microscope, in combination with the easiest to use, most comprehensive software and FEI's application expertise, allow for the fastest and easiest preparation of site-specific, ultra-thin HR-S/TEM samples for a wide range of materials.
Quanta SEM for Materials Science
The Quanta 50 SEM series is the third generation Quanta system built on the success of previous generations of ESEM Schottky FEG. This series has an easy-to-use and flexible user interface with functions to maximize productivity and allow all the data to be collected. Designed by microscopists for microscopists, this instrument series is truly above and beyond 'easy to use'.
Q250 Analytical SEM for Materials Science

The Q250 scanning electron microscope (SEM) addresses your need to investigate a wide variety of materials while characterizing their structure and composition. Surface and compositional images combined with elemental data from the UltraDry™ EDS detector provide a high-throughput data analysis solution for labs with versatile research needs. 

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