Prisma E SEM
Talos F200i TEM
Explore MyScope Outreach
The 2016 Image Contest Grand Prize Winner
ASCB - EMBO 2018 meeting
Learn how to engage in cryo-EM SPA
2017 Nobel Prize for Chemistry
Webcast: How Image Accuracy Impacts Your Research
What's new in PerGeos 1.1
First generation Helios with improved SEM for cross-section imaging and end point detection.
XHR SEM combined with new Tomahawk FIB for improved TEM sample prep and cross-section imaging.
Integrated hardware and automated recipes enable higher throughput, higher quality TEM sample prep.
First DualBeam to create sub 7nm thick TEM samples.
Helios G4 HX for Semiconductors
Helios G4 FX for Semiconductors
Helios G4 FX for Materials Science
Helios G4 UX for Materials Science
Helios G4 CX for Materials Science
All FEI Helios DualBeams