iCT Conference 2018
Avizo for industrial inspection pre-conference workshop @ iCT 2018
Avizo for materials sciences pre-conference workshop @TMS2018
Explore MyScope Outreach
The 2016 Image Contest Grand Prize Winner
AMSMIC Annual Meeting
2018 AACBNC Annual Winter Conference
International Congress of Cell Biology
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First generation Helios with improved SEM for cross-section imaging and end point detection.
XHR SEM combined with new Tomahawk FIB for improved TEM sample prep and cross-section imaging.
Integrated hardware and automated recipes enable higher throughput, higher quality TEM sample prep.
First DualBeam to create sub 7nm thick TEM samples.
Helios G4 HX for Semiconductors
Helios G4 FX for Semiconductors
Helios G4 FX for Materials Science
Helios G4 UX for Materials Science
Helios G4 CX for Materials Science
All FEI Helios DualBeams