DIGITAL IMAGING 2018
Advanced DualBeam automation for every need
Prisma E SEM
Technology Forum: Modern Electron Microscopy in Physical & Life Sciences
Zebrafish Disease Models Society
13th Göttingen Meeting of the German Neuroscience Society
CMI Workshops and Training
SPE ATCE 2018
SEG International Exposition and 88th Annual Meeting 2018
First generation Helios with improved SEM for cross-section imaging and end point detection.
XHR SEM combined with new Tomahawk FIB for improved TEM sample prep and cross-section imaging.
Integrated hardware and automated recipes enable higher throughput, higher quality TEM sample prep.
First DualBeam to create sub 7nm thick TEM samples.
Helios G4 HX for Semiconductors
Helios G4 FX for Semiconductors
Helios G4 FX for Materials Science
Helios G4 UX for Materials Science
Helios G4 CX for Materials Science
All FEI Helios DualBeams