ASNT Annual Conference 2017
Talos F200i TEM
Explore MyScope Outreach
The 2016 Image Contest Grand Prize Winner
Krios G3i Cryo-TEM
What's new in PerGeos 1.1
Webcast: How Image Accuracy Impacts Your Research
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First generation Helios with improved SEM for cross-section imaging and end point detection.
XHR SEM combined with new Tomahawk FIB for improved TEM sample prep and cross-section imaging.
Integrated hardware and automated recipes enable higher throughput, higher quality TEM sample prep.
First DualBeam to create sub 7nm thick TEM samples.
Helios G4 HX for Semiconductors
Helios G4 FX for Semiconductors
Helios G4 FX for Materials Science
Helios G4 UX for Materials Science
Helios G4 CX for Materials Science
All FEI Helios DualBeams
Electron Microscopy Solutions
We have updated the appearance of FEI.com with the Thermo Fisher Scientific brand. This transition is an exciting moment as we continue to advance our world-leading electron microscopy solutions.