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Electron Microscopy Solutions

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Using DualBeam to prepare the highest quality samples for atomic scale HR-S/TEM

LaB6 emitter failure case study - LaB6 emitters are widely used in electron microscopy as high brightness electron sources, owing to their favorable properties for thermionic emission: low work function and high melting point. The emitter consists of an LaB6 single crystal with a carefully shaped tip. This study offers an unprecedented characterization of a worn-out LaB6 emitter down to the atomic level.

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