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Electron Microscopy Solutions

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Ultra-fast in situ S/TEM sample preparation

Complete sample preparation in under 30 minutes - The DualBeam™ (FIB/SEM) offers the capability of both highly localized sample preparation and high resolution sample analysis. Site specific cross-sections and S/TEM samples through disparate materials can be prepared using FIB milling, while simultaneous SEM imaging can be used to monitor the sample preparation, allowing the section to be precisely positioned.

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