|   Electron Microscopy Solutions

Electron Microscopy Solutions

Download the datasheet

TEMLink System Datasheet

Key Benefits

  • Consistent, repeatable, and fast extraction of up to 20 lamella/hour (based on 1 wafer) with proven robustness of >90%. Probe lifetime is >150 lamella (use case dependent).
  • FOUP based file management with a completely redesigned workflow allows for automatic reading of a docked FOUP’s carrier ID, and then association of the FOUP with the appropriate site lists without user interaction.
  • Flexibility for users to search, sort, and select sites for plucking from the loaded FOUP to accommodate hot lots for processing.
  • Workflow connectivity allows critical process data to be tracked through sample prep and plucking. This data is passed to the downstream Thermo Scientific Metrios™ DX TEM. At plucking completion, an overview image of the grid is available or viewing along with site information for each lamella.

Please provide or confirm your information to download your document.


Fields marked with an asterisk (*) are required

I’d like to receive information about Thermo Scientific products and services via email.
submitting your request...