Talos F200S datasheet
The FEI Talos™ F200S 200kV scanning/transmission electron microscope (S/TEM) combines fast, multichannel, high resolution S/TEM imaging and precise compositional analysis to enable for dynamic microscopy applications. With innovative features designed to increase throughput, precision, and ease of use, FEI Talos is ideal for advanced research and analysis across academic, government, and industrial research environments.
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