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Electron Microscopy Solutions

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Site-specific metrology, inspection, and failure analysis of three-dimensional interconnects using focused ion beam technology

In this article, the Fraunhofer Institute and FEI show how the plasma-FIB is a very attractive tool for the analysis of relatively large, complex interconnect structures, such 3DICs, without any need for mechanical preparation steps.

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2017 Nobel Prize in Chemistry

Congratulations to the winners of the 2017 Nobel Prize in Chemistry. Three scientists; Dr. Jacques Dubochet, Dr. Joachim Frank, and Dr. Richard Henderson, were awarded the prize for their developments within Cryo-Electron Microscopy.

We are extremely proud of what these researchers and the structural biology community have achieved.