|   Electron Microscopy Solutions

      
Electron Microscopy Solutions
      

Download the application brochure

Information from every Angle - Directional BSE detector for next-level imaging

Directional BSE detector for next-level imaging - This application note will look at the different signals available, and methodologies to capture all of the available information. Repeatedly imaging a sample to gather all of the required information can often lead to sample damage and contamination. The Directional Backscatter Detector, available on all Thermo Scientific™ SEM and DualBeam systems offers a unique way to simultaneously capture information from every angle, while other benefits such as filtering of charge while imaging non-conductive specimen is also realized.

Please provide or confirm your information to download your document.

Download

Fields marked with an asterisk (*) are required

*
* 
* 
* 
* 
* 
*


 
I’d like to receive information about Thermo Scientific products and services via email.
 
*
 
submitting your request...