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Electron Microscopy Solutions

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Information from every Angle - Directional BSE detector for next-level imaging

Directional BSE detector for next-level imaging - This application note will look at the different signals available, and methodologies to capture all of the available information. Repeatedly imaging a sample to gather all of the required information can often lead to sample damage and contamination. The Directional Backscatter Detector, available on all FEI's SEM and DualBeam systems offers a unique way to simultaneously capture information from every angle, while other benefits such as filtering of charge while imaging non-conductive specimen is also realized.

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