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EasyLift Datasheet

FEI DualBeam™ systems, known for fast creation of precise and consistent TEM lamellae, can now be equipped with the new EasyLift™ NanoManipulator system for in situ sample lift-out.

The EasyLift system allows operators to extract the lamella and attach it to a TEM grid, all within the DualBeam chamber. In the DualBeam, FEI's iFAST™ software guides the process of easy, repeatable creation of ultra-thin TEM lamellae, allowing even novice operators to create high-quality TEM samples with tremendous confidence.

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