|   Electron Microscopy Solutions

    
Electron Microscopy Solutions
    

Download the white paper

DualBeam Solutions for Electrical Nanoprobing

Testing and failure analysis of integrated circuits has traditionally been done by physical electrical probes guided by optical microscopy. However, today's geometries are too small for conventional electrical probing techniques. DualBeam systems have been adapted to solve nanoprobing challenges. The tools are routinely used to perform failure analysis, fault isolation, device debug, and circuit editing-enabling engineers to quickly diagnose design and production problems and to determine corrective actions. DualBeam probe testing during development and production ramp-up can improve device yield and performance and greatly speed time-to-market.

Please provide or confirm your information to download your document.

Download

Fields marked with an asterisk (*) are required

*
* 
* 
* 
 
I’d like to receive information about Thermo Scientific products and services via email.
 
*
 
submitting your request...