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Electron Microscopy Solutions

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DualBeam Solutions for Electrical Nanoprobing

Testing and failure analysis of integrated circuits has traditionally been done by physical electrical probes guided by optical microscopy. However, today's geometries are too small for conventional electrical probing techniques. DualBeam systems have been adapted to solve nanoprobing challenges. The tools are routinely used to perform failure analysis, fault isolation, device debug, and circuit editing-enabling engineers to quickly diagnose design and production problems and to determine corrective actions. DualBeam probe testing during development and production ramp-up can improve device yield and performance and greatly speed time-to-market.

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2017 Nobel Prize in Chemistry

Congratulations to the winners of the 2017 Nobel Prize in Chemistry. Three scientists; Dr. Jacques Dubochet, Dr. Joachim Frank, and Dr. Richard Henderson, were awarded the prize for their developments within Cryo-Electron Microscopy.

We are extremely proud of what these researchers and the structural biology community have achieved.