Characterizing New Materials with Electron Microscopy
The Scanning Electron Microscope (SEM) continues to be one of the most powerful and versatile instruments used in research, development and manufacturing environments. The SEM has the ability to image a wide variety of sample types and sizes, often with minimal sample preparation, and is capable of generating multiple analysis signals, providing high-resolution information about the composition, phase, electrical, optical, and other properties of a sample.
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