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RAPID + TCT is where the entire additive manufacturing community convenes, and where industry-accelerating products are launched. The expansive show floor and conference are unparalleled in the industry. It’s where you’ll see the newest 3D technologies from over 300 exhibitors, including 3D printing, 3D scanning, CAD/CAE, metrology & inspection, and related technologies. It’s also where you’ll find solutions to your toughest manufacturing challenges, straight from the most respected experts. Don’t miss out on North America’s most influential additive manufacturing event.
Location : Cobo Center, Booth #947, Detroit, MI
Date : May 20 - May 23, 2019
Thermo Scientific Introduces Prisma E SEM for Materials Science, the most complete SEM for multi-user laboratories requiring all-round performance and ease-of-use.
The resolution revolution and tremendous growth in groundbreaking scientific results have recognized cryo-electron microscopy single particle analysis (cryo-EM SPA) as a main stream structure biology technique for the investigation of: Dynamic biological processes, Structures, such as membrane proteins that are difficult to resolve with other techniques, and Structures of protein complexes, aggregates and large virus assemblies. Thermo Fisher Scientific provides a full workflow solution and gives advice to set up your cryo-EM laboratory.
Jacques Dubochet, Joachim Frank, and Richard Henderson win the 2017 Nobel Prize in Chemistry for their part in developing cryo-EM.
Thermo Scientific Introduces Quattro SEM for Materials Science, an ultra-versatile high-resolution SEM with unique environmental capability.
The first dedicated Cryo-DualBeam System is here, to prepare cryo-lamellas for cryo-electron tomography.
Thermo Scientific Introduces Talos F200i TEM, designed for performance and productivity across a wide range of Materials Science applications.
The new Thermo Scientific™ Krios™ G3i Cryo-TEM unravels life at the molecular level—faster, easier and more reliably.
The Thermo Scientific™ Glacios™ Cryo Transmission Electron Microscope (Cryo-TEM) makes Single particle screening and data acquisition easy.
We’re proud to introduce three new products to our leading semiconductor portfolio. These products are designed to help semiconductor failure analysis labs achieve higher volumes of samples and faster time-to-data.
FEI and the Australian Microscopy & Microanalysis Research Facility (AMMRF) are partners on MyScope™ Outreach, a free online platform that gives students a glimpse into the microscopic world around them.
Dr. Xuekun Lu from the University College London demonstrates multi-length scale imaging and the simulation of a novel-structured tubular SOFC anode to obtain effective mass transport.