NanoEx-i/v

• Perform atomic-resolution, in situ experiments.

  The FEI NanoEx-i/v TEM single-tilt holder is a MEMS-based solution that significantly improves stability for heating and biasing applications to enable S/TEM experiments with atomic resolution.​​

• Achieve the most accurate monitoring of your experiment parameters.​

  Temperature values used in in situ experiments are now quantitative-with guaranteed accuracy and reproducibility. Designed to accept a variety of samples, from nanoparticles to FIB-prepared lamellas, NanoEx-i/v offers precise, built-in heating control and uniform temperature distribution over the heated area.​

• Conduct simultaneous heating, biasing, and/or EDS experiments.​

  NanoEx-i/v allows you to combine your heating experiments with electrical measurements to deliver a greater range of data from your materials samples. Optimization with FEI ChemiSTEM™ Technology enables analysis of compositional changes correlated with temperature and electrical stimuli.

Introduction to the NanoEx i/v holder​

Application Example :  NanoEx i/v holder​

Application Example: Talos TEM and the NanoEx holder

The ability to perform compositional analysis for in situ elemental characterization of nanomaterials, both at room temperature and during heating, provides important insight to structural and compositional changes. In this use case, we demonstrate the use of NanoEx-i/v in the dynamic inter-diffusion process of Silicon through an Aluminum oxide interlayer which results in the growth of large crystalline grains of Silicon, used to design solar cells and transistors. To understand the compositional and structural changes induced by the applied heating, the Al and Si elemental live maps were acquired at every temperature.p