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Electron Microscopy Solutions
      

CompuStage Multi-Specimen Holder

Specimen holder that handles multi specimen and ideal for combination with EDX.





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Key Benefits:

 

  •  Fully controlled by CompuStage controller
  •  For combination with EDX
  •  Handling multiple specimen for efficiency
  •  High accuracy
  •  Optimized specimen clamping
  •  Easy, accurate specimen loading and centering

Notes:

  • The specimens mounted in this holder can be tilted ± 60° around the main tilt axis; the maximum attainable field of view for tomography is ± 25°;
  • Specimen movement is fully controlled by the CompuStage controller making the system fully safe and allowing maximum tilt for each XYZ position;
  • It incorporates a Safe ENTRY key for use with the sENTRY system to prevent Hs insertion into the wrong lens;
  • It is supplied with an insert, which accommodates up to 3 grid-mounted specimens;
  • It is incompatible with S-TWlN and U-TWlN lenses.

Applications:

  • Examination (rapid assessment) of a series of specimens with high throughput efficiency prior to more detailed examination
  • General investigations of life - and material science specimens
  • Visual quality control of removable platinum and thin-foil microscope apertures
  • Observation of bulk life- and material science specimens, in association with Backscattered or secondary electron detection modes and x-ray detection (point, line and mapping) mode
  • X-ray analysis of bulk specimens
  • Compositional analysis with standards

 

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