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Electron Microscopy Solutions

CompuStage Low-Background, Double-Tilt Specimen Holder

Double tilt TEM specimen holder ideal for combination with EDX.





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Key Benefits:

  •  Fully controlled by CompuStage controller
  •  Can be used in combination with Fixed beryllium cryo shields for 120 kV
  •  Ideal for combination with EDX
  •  High accuracy
  •  Optimized specimen clamping
  •  Easy, accurate specimen loading and centering

Notes:

  • The holder enables the specimen to be tilted in two directions perpendicular to each other, one (whose angle depends on the lens) around the main tilt axis, the second one (± 30°) around the Y-axis
  • The second tilt is read out and displayed with an accuracy of 0.1°
  • It incorporates the HexRing™ mounting mechanism, which is ideal for fast and reliable mounting of all specimens
  • Holder parts exposed to the electron beam are made of beryllium
  • Specimen movement is fully controlled by the CompuStage controller making the system fully safe and allowing maximum tilt for each XYZ-beta tilt position
  • It incorporates a Safe ENTRY key for use with the sENTRY system to prevent its insertion into the wrong lens
  • It is incompatible with the U-TWlN lens
  • Accepts 3.05 mm diameter grid with maximum thickness 0.34 mm

Applications:

  • Investigation of crystalline specimens
  • Stereo pair information of crystalline specimens
  • Specimen orientation for high-resolution imaging
  • Orientation dependent contrast and diffraction analysis
  • Grain boundary
  • Domain structure analysis
  • X-ray microanalysis, combined with structure studies of crystalline specimens
  • Investigations of orientations effects in X-ray analysis

 

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