|   Electron Microscopy Solutions

    
Electron Microscopy Solutions

CompuStage High-Visibility, Low-Background, Double-Tilt Specimen Holder

Double tilt TEM specimen holder ideal for combination with EDX.





Need more information?

Add to my Upgrades and Accessories List

Add Item and Request a Quote

Find another Accessory

Key Benefits:

  •  Fully controlled by CompuStage controller
  •  Can be used in combination with Fixed beryllium cryo shields for 120 kV
  •  Ideal for combination with EDX
  •  High accuracy
  •  Optimized specimen clamping
  •  Easy, accurate specimen loading and centering

 Notes:

  • The holder enables the specimen to be tilted in two directions perpendicular to each other, one (whose angle depends on the lens) around the main tilt axis, the second one (± 30°) around the Y-axis, depending on pole configuration
  • The second tilt is read out and displayed with an accuracy of 0.1°
  • It incorporates the SoftLoc mounting mechanism, which is ideal for fast and reliable mounting of all specimens
  • Holder parts exposed to the electron beam are made of beryllium; SoftLoc clips are available in molybdenum and bronze
  • Specimen movement is fully controlled by the CompuStage controller making the system fully safe and allowing maximum tilt for each XYZ-beta tilt position
  • It incorporates a Safe ENTRY key for use with the sENTRY system to prevent its insertion into the wrong lens
  • It is compatible with all condenser lens types (TWIN, BioTWIN, S-TWIN, X-TWIN and U-TWIN)
  • Accepts 3.05 mm diameter grid with maximum thickness 0.34 mm
  • The grid height in the holder can be adjusted to get a large horizontal field of view for EDS
  • Included in delivery are 40 SoftLoc clips (20 molybdenum and 20 bronze) and 40 grid height adjusters (20 of 0.1 mm and 20 of 0.2 mm)

Applications:

  • Investigation of crystalline specimens
  • Stereo pair information of crystalline specimens
  • Specimen orientation for high-resolution imaging
  • Orientation dependent contrast and diffraction analysis
  • Grain boundary
  • Domain structure analysis
  • X-ray microanalysis, combined with structure studies of crystalline specimens
  • Investigations of orientations effects in X-ray analysis

 

Find More Items

My Upgrades & Accessories List

no items have been added