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Electron Microscopy Solutions

CompuStage Double-Tilt Holder with SoftLoc

TEM specimen holder ideal for investigation of crystalline specimens.





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Key Benefits:

  •  Fully controlled by CompuStage controller
  •  Use in combination with Fixed beryllium cryo shields for 120 kV
  •  High accuracy
  •  Optimized specimen clamping
  •  Easy, accurate specimen loading and centering

 Notes:

  • The holder enables the specimen to be tilted in two directions perpendicular to each other, one (whose angle depends on the lens) around the main tilt axis, the second one (± 30°) around the Y-axis
  • Both tilts are read out and displayed with an accuracy of 0.1°
  • It incorporates the unique SoftLoc clamping mechanism, which is ideal for brittle specimens
  • Specimen movement is fully controlled by the CompuStage controller making the system fully safe and allowing maximum tilt for each XYZ-beta tilt position. It incorporates a Safe ENTRY key for use with the sENTRY system to prevent Hs insertion into the wrong lens
  • It is incompatible with the U-TWlN lens

Applications:

  • Investigation of crystalline specimens
  • Stereo pair information of crystalline specimens
  • Specimen orientation for high-resolution imaging
  • Orientation dependent contrast and diffraction analysis
  • Grain boundary
  • Domain structure analysis

 

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