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Electron Microscopy Solutions

CompuStage Double-Tilt Holder for U-TWIN

Double tilt TEM specimen holder ideal for combination with EDX.

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Key Benefits:


  •  Fully controlled by CompuSage controller
  •  Ideal for combination with EDX
  •  High accuracy
  •  Optimized specimen clamping
  •  Easy, accurate specimen loading and centering


  • The holder enables the specimen to be tilted in two directions perpendicular to each other, one up to ± 22° around the main tilt axis, the second one (± 15°) around the Y-axis
  • The second tilt is read out and displayed with an accuracy of 0.1°
  • It incorporates the unique SoftLoc clamping mechanism, which is ideal for brittle specimens
  • Specimen movement is fully controlled by the CompuStage controller making the system fully safe and allowing maximum tilt for each XYZ-beta tilt position
  • It incorporates a Safe ENTRY key for use with the sENTRY system to prevent its insertion into the wrong lens
  • Accepts 3.05 mm diameter grid with maximum thickness 0.2 mm


  • Investigation of crystalline specimens
  • Stereo pair information of crystalline specimens
  • Specimen orientation for high-resolution imaging
  • Orientation dependent contrast and diffraction analysis
  • Grain boundary
  • Domain structure analysis
  • X-ray microanalysis, combined with structure studies of crystalline specimens
  • Investigations of orientations effects in X-ray analysis


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