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Electron Microscopy Solutions

CDEM Detector

Channel Detection Electron Multiplier (CDEM) for direct ion imaging and ion-induced secondary electron imaging. The geometry of the detector is optimized for imaging with the ion column resulting in excellent Signal/Noise in ion imaging, as opposed to the Everhart Thornley SED which is optimized for S/N in electron imaging.





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Key Benefits:

  •  Excellent Signal to Noise ratio in Ion Imaging
  •  Direct ion Imaging
  •  Direct Ion-induced SE imaging
  •  In-chamber detector

The CDEM detector can be used in combination with the charge neutralizer providing ion imaging while the specimen is flooded with electrons to neutralize charge.

 

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Electron Microscopy Solutions

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