|   Electron Microscopy Solutions

Electron Microscopy Solutions

CDEM Detector

Channel Detection Electron Multiplier (CDEM) for direct ion imaging and ion-induced secondary electron imaging. The geometry of the detector is optimized for imaging with the ion column resulting in excellent Signal/Noise in ion imaging, as opposed to the Everhart Thornley SED which is optimized for S/N in electron imaging.

Need more information?

Add to my Upgrades and Accessories List

Add Item and Request a Quote

Find another Accessory

Key Benefits:

  •  Excellent Signal to Noise ratio in Ion Imaging
  •  Direct ion Imaging
  •  Direct Ion-induced SE imaging
  •  In-chamber detector

The CDEM detector can be used in combination with the charge neutralizer providing ion imaging while the specimen is flooded with electrons to neutralize charge.


Find More Items

My Upgrades & Accessories List

no items have been added

Electron Microscopy Solutions

We have updated the appearance of FEI.com with the Thermo Fisher Scientific brand. This transition is an exciting moment as we continue to advance our world-leading electron microscopy solutions.