FEI Accessories

Accessory Type
Instrument Type
Instrument Family
57 Accessories found   |   Reset all options
Back  | 1 2 3 4 5  | Next 
/uploadedImages/FEISite/Pages/Products/Accessories/FalconImage II.png

Falcon 3EC Direct Electron Detector

The Falcon 3EC fully integrates into a fast, automated workflow on the FEI Titan Krios and FEI Talos Arctica. Not only has the detector sensitivity been improved, but so has the handling of data produced by the detector. Now, when using an FEI workflow that features the Falcon 3EC, you will be able to achieve high throughput and faster time to data without compromising performance. And it is easy to use, especially for non-microscopists.

/uploadedImages/FEISite/Pages/Products/Accessories/NanoEx_Indenter_465x465.png

NanoEx 3D Indenter

The FEI NanoEx 3D is a double-tilt TEM specimen holder that includes a nanoindenter system allowing in-situ nano-indentation specimen characterization.​ Record in situ point-to-point force measurement plus conductivity. The holder features double-tilt movement with a unique, patented 3D Piezo probe and MEMS-based indenter. Dynamic nano-mechanical processes, such as hardness, strain, adhesion, etc., can be studied, characterized, and quantified.

/uploadedImages/FEISite/Pages/Products/Accessories/NanoEx_Electrical_Probe_465x465.png

NanoEx 3D STM and Electrical Probe

The FEI NanoEx 3D STM and Electrical Probe is our new TEM specimen holder with a patented Piezo-controller 3D probe for in situ S/TEM imaging and elemental analysis at elevated temperatures.

Introduce measurement of contact current, displacement, bias, time, tunneling, and field emission currents to your in situ experiments. STM and electrical probing are conducted with a Piezo probe in this double-tilt holder.

/uploadedImages/FEISite/Pages/Products/Specialty_Products/Falcon(1)/Models/nanoex-for-web_002_465x.png

NanoEx-i-v

Know the temperature. Understand your sample.​

The FEI NanoEx-i/v is a single-tilt TEM specimen heating and biasing holder for in situ S/TEM imaging and elemental analysis at elevated temperatures.​ NanoEx-i/v is the ideal solution for precise experiments in a wide range of applications that require in situ heating of nanomaterials, such as studies of nanoscale annealing behavior, phase transformations in metals, structural changes and sintering phenomena in catalyst nanosystems, quenching, segregation/diffusion phenomena, and more.​

/uploadedImages/FEISite/Pages/Products/Specialty_Products/Vitrobot(1)/Models/Doxorubicin,-with-FEI-Phase-Plate_001_465x.png?n=5079

Phase Plate

Increase contrast and retrieve more information from delicate biological samples with the FEI Phase Plate. Engineered for high quality, stability and longevity, the FEI Phase Plate is the ideal companion to demanding cutting-edge Cryo-TEM biological research.

/uploadedImages/FEISite/Pages/Products/Accessories/1000CHeatingStage.JPG?n=1914

1000 °C Heating Stage

The 1000 °C heating stage is used to heat samples and record in-situ morphological sample changes.

/uploadedImages/FEISite/Pages/Products/Accessories/1400CHeatingStage.jpg

1400 ºC Heating Stage

The 1400 ºC heating stage is the total heating solution to record in-situ morphological sample changes during heating up to 1400 ºC.

/uploadedImages/FEISite/Pages/Products/Accessories/70TiltCryoHolder.JPG

70° Tilt Cryo-transfer Holder

The Gatan 70° tilt cryo-transfer system enables frozen suspensions or sections to be loaded into the TEM holder and transferred frost-free at temperatures below -170 °C.

/uploadedImages/FEISite/Pages/Products/Accessories/AcousticEnclosure.JPG

Acoustic Enclosure

The acoustic enclosure is a cover that fits the various pump(s) of the microscope system. It provides noise dampening of the pump(s) for operator and microscope. Check which enclosures we have available for your instrument.

/uploadedImages/FEISite/Pages/Products/Accessories/BioTwin2.JPG

BioTWlN Low-Background, Single-Tilt Holder

TEM specimen holder constructed to eliminate the stray background peaks in the X-ray spectrum.

/uploadedImages/FEISite/Pages/Products/Accessories/CarbonDeposition.JPG

Carbon Deposition

Gas chemistry solution (Naphthalene) for Ion or Electron beam deposition of Carbon-based material, mounted on any of the available GIS ports.

/uploadedImages/FEISite/Pages/Products/Accessories/CDEMDetector.jpg

CDEM Detector

Channel Detection Electron Multiplier (CDEM) for direct ion imaging and ion-induced secondary electron imaging. The geometry of the detector is optimized for imaging with the ion column resulting in excellent Signal/Noise in ion imaging, as opposed to the Everhart Thornley SED which is optimized for S/N in electron imaging.