- The holder enables the specimen to be tilted in two directions perpendicular to each other, one (whose angle depends on the lens) around the main tilt axis, the second one (± 30°) around the Y-axis
- The second tilt is read out and displayed with an accuracy of 0.1°
- It incorporates the HexRing™ mounting mechanism, which is ideal for fast and reliable mounting of all specimens
- Holder parts exposed to the electron beam are made of beryllium
- Specimen movement is fully controlled by the CompuStage controller making the system fully safe and allowing maximum tilt for each XYZ-beta tilt position
- It incorporates a Safe ENTRY key for use with the sENTRY system to prevent its insertion into the wrong lens
- It is incompatible with the U-TWlN lens
- Accepts 3.05 mm diameter grid with maximum thickness 0.34 mm
CompuStage Low-Background, Double-Tilt Specimen Holder for studies like:
- Investigation of crystalline specimens
- Stereo pair information of crystalline specimens
- Specimen orientation for high-resolution imaging
- Orientation dependent contrast and diffraction analysis
- Grain boundary
- Domain structure analysis
- X-ray microanalysis, combined with structure studies of crystalline specimens
- Investigations of orientations effects in X-ray analysis
Installation by Field Service Engineer:
No
Works With Tools:
Tecnai and Titan (excluding U-twin lens)
Availability:
3 months after receipt order
Air Transportation Packaging:
Yes
Estimated Installation Duration:
n.a.
(Warranty included as standard. Product availability is subject to change
without notice and all offers are subject to an authorized quotation.)