The Nova NanoLab brings new capabilities and flexibility to researchers and developers needing to create, modify, and characterize complex structures below 100 nanometers. It combines ultra-high resolution field emission scanning electron microscopy (SEM) and precise focused ion beam (FIB) etch a...
Addressing the need to investigate a wide variety of materials and characterize structure and composition, the FEI QuantaTM provides flexibility and versatility to handle the challenges of today’s wide ranging research needs. View any sample and get all the data: surface and compositional images ...
Site Specific Three-dimensional Structural Analysis in Tissues and Cells Using Automated DualBeam Slice & View Software