With the Nova NanoSEM 50 series, even more becomes possible. In addition to the powerful combination of advanced optics (including a two-mode final lens), SE/BSE (Secondary Electrons/Backscattered Electrons) in-lens detection and beam deceleration, the Nova NanoSEM 50 series introduces a new suite of latest generation, high sensitivity retractable SE/BSE and STEM detectors, as well as versatile SE/BSE filtering capabilities, to best optimize the information of interest. Intelligent scanning modes are available to minimize imaging artefacts.
Advanced DualBeam for Integrated S/TEM Sample Preparation, Imaging and Analysis
The affordable mineral analysis solution with all the benefits of best in class automation and phase classification
The versatile, flexible, automated mineral analyzer
[PDF; Product Data Sheet] microValidator (tm) - A package for validating the operation of SEM/EDS systems, especially for automated particle and phase search applications, such as GSR (gunshot residue) and MLA (Mineral Liberation Analysis