The FEI Nova™ NanoSEM line of SEMs provides high-quality nanoscale research tools for a variety of applications that involve sample characterization, analysis, nanoprototyping, and S/TEM sample preparation.

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Tecnai™ with iCorr™

FEI’s Tecnai™ with iCorr™, combines fluorescence light and electron microscopes into a single, harmonized instrument for faster throughput and time-to-data, plus greater efficiency with the least amount of sample handling.

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APPLICATIONS

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New Methods in Correlative Microscopy

FEI has changed the way correlative microscopy is conducted, with new solutions designed for ease of use, accuracy and efficiency. Both light and electron microscopists will appreciate FEI’s comprehensive methods.

Learn about FEI Correlative Microscopy Solutions

New 3D EDX Elemental Characterization

The revolution in X-ray analytics continues. New 3D chemical mapping capability delivers additional information for a more thorough understanding of the relationship between function, properties and structure, at the nanoscale.

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Mouse Trachea. Courtesy of Matthew Sharp.

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FEI NanoPorts Welcome Visitors from Around the World

FEI NanoPorts provide a welcoming and private environment to visitors interested in FEI's electron microscopy solutions and their capabilities.

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The FEI Sales team is just a phone call or click away - Find a local sales office using our Worldwide Locator, or contact FEI using our online form. We'll route your request to the nearest sales office for fast response.

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Enhance system responsiveness and reduce system downtime through remote diagnostics, access to factory experts, and real-time assistance.

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An Introduction to Electron Microscopy

Read the FEI booklet "An Introduction to Electron Microscopy", an excellent resource on electron microscopy and nanotechnology for students and teachers.

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FEI Image Gallery

Sperm tails tangled up in a seminiferous tubule. Courtesy of Clifford Barnes.

Visit the image gallery and see amazing nano-scale images from FEI and our owners and users.

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Upcoming Events

SCANDEM
Copenhagen, Denmark
May 13, 2013 - May 18, 2013

ASMC
Saratoga Springs, New York
May 14, 2013 - May 16, 2013

Japanese Society of Microscopy
Osaka, Japan
May 20, 2013 - May 22, 2013

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OWNERS

Experience the Benefits of Ownership

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FEI offers a variety of training courses aimed at improving skills to get maximum results from your instrument.

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