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Cellular Biology Future ChallengesStrasbourg, France May 24, 2012 - May 25, 2012
Structural Biology GRC Three Dimensional Electron MicroscopyLes Diablerets, Switzerland May 27, 2012 - Jun 01, 2012
Correlative light and electron microscopy: different flavorsWebinarMay 29, 2012 - May 29, 2012
The FEI Nova™ NanoSEM line of SEMs provides high-quality nanoscale research tools for a variety of applications that involve sample characterization, analysis, nanoprototyping, and S/TEM sample preparation.
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The revolution in X-ray analytics continues. New 3D chemical mapping capability delivers additional information for a more thorough understanding of the relationship between function, properties and structure, at the nanoscale.
Driving Innovation in Semiconductor and Data Storage
FEI has been producing cutting-edge solutions for the semiconductor and data storage industry for decades. Learn more about our market-leading instruments.
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Routine probe current on Titan 80-300?
4/23/2012 Posted by: n.ni@imperial.ac.ukViews: 9 Replies: 0
Direct Alignments in TUI with user privileges
3/19/2012 Posted by: konya@chem.u-szeged.huViews: 21 Replies: 0
TIA for Windows 7
1/27/2012 Posted by: duttai@corning.comViews: 57 Replies: 0
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The Quanta 3D DualBeam brings new capabilities and flexibility to materials characterization, failure analysis and process control. These instruments combine traditional thermal emission Scanning Electron Microscopy (SEM) with a Focused Ion Beam (FIB) to complement your existing characterization laboratory tools and extends your applications range for 3D characterization and nanoanalysis, TEM sample preparation or structural modification of sample surfaces at the nanometer scale.