FEI.com for Owners is an online portal of tools and resources exclusively for instrument owners and users. Register now and gain access to:
Stay informed about FEI products, technologies, events, and more with the FEI Focus series of newsletters.
View current issues:
Visit the Newsletter Center
SCANDEMCopenhagen, DenmarkMay 13, 2013 - May 18, 2013
ASMCSaratoga Springs, New YorkMay 14, 2013 - May 16, 2013
Japanese Society of MicroscopyOsaka, JapanMay 20, 2013 - May 22, 2013
The FEI Nova™ NanoSEM line of SEMs provides high-quality nanoscale research tools for a variety of applications that involve sample characterization, analysis, nanoprototyping, and S/TEM sample preparation.
FEI’s Tecnai™ with iCorr™, combines fluorescence light and electron microscopes into a single, harmonized instrument for faster throughput and time-to-data, plus greater efficiency with the least amount of sample handling.
FEI has changed the way correlative microscopy is conducted, with new solutions designed for ease of use, accuracy and efficiency. Both light and electron microscopists will appreciate FEI’s comprehensive methods.
The revolution in X-ray analytics continues. New 3D chemical mapping capability delivers additional information for a more thorough understanding of the relationship between function, properties and structure, at the nanoscale.
Use our Sales Locator to find an FEI regional sales office near you.
FEI NanoPorts Welcome Visitors from Around the World
FEI NanoPorts provide a welcoming and private environment to visitors interested in FEI's electron microscopy solutions and their capabilities.
The FEI Sales team is just a phone call or click away - Find a local sales office using our Worldwide Locator, or contact FEI using our online form. We'll route your request to the nearest sales office for fast response.
Use our global Service Locator to find an FEI service center near you.
Enhance system responsiveness and reduce system downtime through remote diagnostics, access to factory experts, and real-time assistance.
Imaging and patterning Silicon Nitride (Si3N4)
5/3/2013 Posted by: liesbet.vanlandschoot@intec.ugent.beViews: 4 Replies: 0
Titan/Tecnai User Interface on Secondary Display?
1/30/2013 Posted by: mms3sf@virginia.eduViews: 18 Replies: 0
Bugs on the NanoSEM
1/15/2013 Posted by: trevor@psu.eduViews: 26 Replies: 0
Read the FEI booklet "An Introduction to Electron Microscopy", an excellent resource on electron microscopy and nanotechnology for students and teachers.
Visit the image gallery and see amazing nano-scale images from FEI and our owners and users.
FEI offers a variety of training courses aimed at improving skills to get maximum results from your instrument.
"Like" Us and Join the Conversation
Join the many fans of FEI on our official Facebook page. Write on our Wall, see the latest Image Contest entries, and stay up-to-date on the latest news and information from FEI.
Visit our Careers area and learn about the exciting opportunities in Mechanical Engineering, Software Development, Program Management, and more. FEI is currently hiring for positions at locations throughout the world.
Add your comments below. Register or login now to comment. Comments are subject to the terms & conditions of membership. Please refrain from inappropriate or profane language. All comments are subject to review by FEI.
The Nova NanoSEM 50 series is a powerful combination of advanced optics (including a two-mode final lens), SE/BSE (Secondary Electrons/Backscattered Electrons) in-lens detection and beam deceleration. The Nova NanoSEM 50 series includes the latest generation of high-sensitivity retractable SE/BSE and STEM detectors, as well as versatile SE/BSE filtering capabilities, to best optimize the information of interest. Intelligent scanning modes are available to minimize imaging artifacts.