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SCANDEMCopenhagen, DenmarkMay 13, 2013 - May 18, 2013
ASMCSaratoga Springs, New YorkMay 14, 2013 - May 16, 2013
Japanese Society of MicroscopyOsaka, JapanMay 20, 2013 - May 22, 2013
The FEI Nova™ NanoSEM line of SEMs provides high-quality nanoscale research tools for a variety of applications that involve sample characterization, analysis, nanoprototyping, and S/TEM sample preparation.
FEI’s Tecnai™ with iCorr™, combines fluorescence light and electron microscopes into a single, harmonized instrument for faster throughput and time-to-data, plus greater efficiency with the least amount of sample handling.
FEI has changed the way correlative microscopy is conducted, with new solutions designed for ease of use, accuracy and efficiency. Both light and electron microscopists will appreciate FEI’s comprehensive methods.
The revolution in X-ray analytics continues. New 3D chemical mapping capability delivers additional information for a more thorough understanding of the relationship between function, properties and structure, at the nanoscale.
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Imaging and patterning Silicon Nitride (Si3N4)
5/3/2013 Posted by: liesbet.vanlandschoot@intec.ugent.beViews: 4 Replies: 0
Titan/Tecnai User Interface on Secondary Display?
1/30/2013 Posted by: mms3sf@virginia.eduViews: 18 Replies: 0
Bugs on the NanoSEM
1/15/2013 Posted by: trevor@psu.eduViews: 26 Replies: 0
Read the FEI booklet "An Introduction to Electron Microscopy", an excellent resource on electron microscopy and nanotechnology for students and teachers.
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