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Altered AFM Tip

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Description

standard AFM tip with University of Utah Logo written on it and probe tip modified. Quanta 3D for logo patterening and NovaNanoSEM for imaging.

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Nova NanoSEM

The Nova NanoSEM 50 series is a powerful combination of advanced optics (including a two-mode final lens), SE/BSE (Secondary Electrons/Backscattered Electrons) in-lens detection and beam deceleration. The Nova NanoSEM 50 series includes the latest generation of high-sensitivity retractable SE/BSE and STEM detectors, as well as versatile SE/BSE filtering capabilities, to best optimize the information of interest. Intelligent scanning modes are available to minimize imaging artifacts.

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