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Biophysical Society Meeting 2012San Diego, CAFeb 25, 2012 - Feb 29, 2012
BioMedicine in 4D ConferencePortland, OregonMar 22, 2012 - Mar 24, 2012
Focus on Microscopy 2012SingaporeApr 01, 2012 - Apr 04, 2012
The FEI Nova™ NanoSEM line of SEMs provides high-quality nanoscale research tools for a variety of applications that involve sample characterization, analysis, nanoprototyping, and S/TEM sample preparation.
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The revolution in X-ray analytics continues. New 3D chemical mapping capability delivers additional information for a more thorough understanding of the relationship between function, properties and structure, at the nanoscale.
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FEI has been producing cutting-edge solutions for the semiconductor and data storage industry for decades. Learn more about our market-leading instruments.
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TIA for Windows 7
1/27/2012 Posted by: duttai@corning.comViews: 6 Replies: 0
using an 835 for TEM prep and liftout
8/22/2011 Posted by: mattlangViews: 39 Replies: 1
TIA Software
8/16/2011 Posted by: spratt1Views: 85 Replies: 1
Read the FEI booklet "An Introduction to Electron Microscopy", an excellent resource on electron microscopy and nanotechnology for students and teachers.
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