Ultra-high resolution to sub-Ångström levels
FEI's market-leading transmission electron microscopes (TEM) feature fully integrated and automated operation for a range of applications requiring ultra-high resolution to sub-Ångström levels. Transmission electron microscopes utilize very thin (0.5 µm or less) samples illuminated by an electron beam. Images are recorded by detecting the electrons that pass though the sample to a system of electromagnetic lenses which focus and enlarge the image on a fluorescent screen, photographic film or digital camera. Magnifications beyond 1,000,000x are attainable with a transmission electron microscope.