Tecnai for Materials Science
The Tecnai G2 transmission electron microscope unifies fast, efficient and easy operation with proven reliability to serve many applications needs - from basic, rapid sample screening to unique, sophisticated experiments requiring superior analytical capabilities. Providing excellent imaging performance, the Tecnai G2 enables high resolution imaging and diffraction data in uncorrected S/TEM. With its high tilt range, automation and dynamic focus adjustment, characterizing it as a TEM with outstanding analytical versatility, Tecnai G2 supports a wide range of techniques including high resolution scanning S/TEM, diffraction, chemical analysis and 3D tomography. The unique field emission gun registry and customizable settings for critical instrument parameters ensure quick results and efficient use management. This accelerates productivity in your multi-user facility, without sacrificing the quality imaging you demand from your daily work.
Tecnai G2 Benefits include:
- No compromise on versatility - multiple techniques work together on one platform, each executed at an optimized performance level.
- Familiar Ease-of-Use - allowing anyone to operate an intuitive TEM platform that delivers imaging and analytical results in the shortest amount of time.
- Enabling new materials insight - taking your research from 2D imaging and analysis to advanced applications like 3D reconstructions for a wide range of studies including specimen structure, diffraction of crystal structure in solids or in situ for visualizing sample morphology.