Welcome to FEI [ Register ] [ ]

Sign In

E-mail address:
Password:

Forgot password?

Not registered? Sign up here

Versa 3D DualBeam™

Watch Versa 3D Video
Challenging Samples

Characterize Difficult Samples

Work with a greater range of samples, even challenging non-conductive materials.

Experience the difference with Versa 3D
TEM Sample Prep

Sample Preparation

The Gold Standard for Sample Preparation

Superior sample prep leads to superior images and analytical results
3D Volume Analysis

Characterize your materials as 3D volumes

Do you know how your materials are distributed? 3D volume analysis with Versa 3D reveals structure.

Versa 3D and Advanced Materials Research
Versa 3D Product Info

Move up to the Versa 3D

Is the old SEM no longer cutting it? Get the details on the Versa 3D and see how you can achieve maximum information from any sample.

Versa 3D Product Information

Discover Versa 3D DualBeam

Developing next generation products requires new materials science tools and capabilities to give researchers the required characterization data to really understand how materials are interconnected and what properties are important for function. This means applying new techniques, for example 3D data acquisition, to fully understand material properties. Traditionally, as Scanning Electron Microscope (SEM) provided enough capabilities for most investigations but for exploring and developing next generation materials, both SEM and Focused Ion Beam (FIB) technology is required. And of the different kinds of SEM/FIB instruments available, the Versa 3D is the one that offers many more capabilities to meet the demands for advanced material analysis.

If you are already familiar with a SEM, consider the many other applications that you can achieve using DualBeam technology with the Versa 3D. You get more capabilities in one platform with fewer limitations to your research options.

With the Versa 3D you can:

Use FIB to expose sub-surface features, material layers or defects, then capture high-resolution images with the SEM.
Use the FIB to collect new information (like channeling contrast information) and access under the surface layer, then use the SEM to collect compositional, density or analytical information, even on samples that are susceptible to charge.
Prepare site-specific lamella for atomic resolution TEM.
Extend your applications range to include in situ dynamic experiments with the optional ESEM mode

New technologies extend the range of samples and applications that can be accommodated on Versa 3D:

Use charge balancing technologies, like low vacuum SEM mode, SmartSCAN, drift compensated frame integration (DCFI) and Drift Suppressed Milling to characterize non-conductive samples and prepare samples from materials prone to charging and drift
Add the optional UC monochromated electron source to allow low voltage, high resolution SEM for beam sensitive samples or other difficult to image materials without giving up excellent analytical performance (Versa 3D High Vacuum only)

Collect Images and Data Easily, even on the Most Difficult Samples

Investigating next generation materials presents new challenges in characterization. Complications such as beam drift or sample damage will hinder your results and can steal critical analysis time. The Versa 3D offers powerful technologies to eliminate these challenges on even the most difficult samples, so you can produce high quality materials characterization results quickly and easily.
See How the Versa 3D Simplifies Characterization »

Versa 3D DualBeam TEM Sample Prep Application Image

Samples Made to Order

If your challenge is to produce high quality samples for TEM investigations or other technique, you will not find a better partner than the Versa 3D. DualBeams have long been used to prepare samples for a variety of characterization or analysis techniques, like STEM or TEM, atomic probe microscopy, hot stage and tensile test experiments, EBSD analysis, or sub-surface feature metrology. Versa 3D extends this capability to a greater range of materials, for high quality, site specific samples.
Discover Superior Sample Preparation with the Versa 3D DualBeam »

Capture All the Data Your Sample has to Share

Advanced materials research and development requires seeing beyond two dimensional images to achieve full understanding of material properties and ultimately, the functions of materials. Access to the 3rd dimension provides this in-depth analysis as well as expanding the range of characterization routines available to you. Discover the complete picture with the Versa 3D DualBeam.
Discover the Complete Picture with the Versa 3D DualBeam »

Versa 3D Video Demos

Watch now

FIB/DualBeam Techniques for Quantitative Analyses

The use of Focused ion beam (FIB) and combined FIB plus scanning electron microscope (SEM) dual platform instruments have continued to increase in popularity over the past decade in both the physical and biological sciences.

Read the Application Note

Learn more about the Versa 3D DualBeam