OEM Custom Products

The world's leading microscopy and analytical systems manufacturers rely on FEI’s columns. We create superior designs and manufacture them using a reliable, high volume methodology.

We offer integrated design services, from initial concept to mass column production. Whether you want a unique column design or to outsource your current column production, your operation will benefit from a partnership with FEI.

Manufacturing excellence

FEI's world-class manufacturing organization relies on established quality practices, from design-for-manufacturability to standard process control techniques. We produce the world's highest volume of electron and ion columns and sources.

FEI component partner OEM customers are involved in the following applications:

• CD SEM
• Electron beam defect review
• Electron beam defect inspection
• High resolution UHV SEM imaging
• Auger analysis
• SPM probe positioning
• SIMS and TOF-SIMS
• Depth profiling
• FIB surface modification