The world's leading microscopy and analytical systems manufacturers rely on FEI’s columns. We create superior designs and manufacture them using a reliable, high volume methodology.
We offer integrated design services, from initial concept to mass column production. Whether you want a unique column design or to outsource your current column production, your operation will benefit from a partnership with FEI.
FEI's world-class manufacturing organization relies on established quality practices, from design-for-manufacturability to standard process control techniques. We produce the world's highest volume of electron and ion columns and sources.
FEI component partner OEM customers are involved in the following applications:
- CD SEM
- Electron beam defect review
- Electron beam defect inspection
- High resolution UHV SEM imaging
- Auger analysis
- SPM probe positioning
- SIMS and TOF-SIMS
- Depth profiling
- FIB surface modification