FEI's electron- and ion-beam products and solutions are driving industry standards for technological innovation and superior performance. From the world's most powerful transmission electron microscope (TEM), the Titan 80-300 , to the Magellan™, the first extreme high-resolution (XHR) scanning electron microscope, FEI is enabling scientists, researchers, engineers, teachers and students to explore further.
Choose a platform below to explore FEI's complete line of scanning electron microscopes (SEM), transmission electron microscopes (TEM), dualbeams (SEM/FIB), and focused ion beam (FIB) instruments.
World-class performance
FEI's market-leading transmission electron microscopes (TEM) feature fully integrated...
Discover Magellan
The world's first extreme high-resolution (XHR) SEM, Magellan. Capable of sub-nanometer resolution at low beam energies.
Discover the benefits of integrated sample preparation and microanalysis from the inventor of the DualBeam™ system.
Learn how companies and researchers worldwide are using FEI solutions to solve difficult challenges at the nanoscale.
Browse Case Studies
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