World-Class Microscopy Products and Solutions from FEI
FEI's electron- and ion-beam products and solutions are driving industry standards for technological innovation and superior performance. From the world's most powerful transmission electron microscope (TEM), the Titan 80-300 , to the Magellan™, the
first extreme high-resolution (XHR) scanning electron microscope, FEI is enabling scientists, researchers, engineers, teachers and students to explore further.
Choose a platform below to explore FEI's complete line of scanning electron microscopes (SEM), transmission electron microscopes (TEM), dualbeams (SEM/FIB), and focused ion beam (FIB) instruments.